22nd International Congress on X-Ray Optics and Microanalysis

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...

An X-ray polarimeter for hard X-ray optics

Development of multi-layer optics makes feasible the use of X-ray telescope at energy up to 60-80 keV: in this paper we discuss the extension of photoelectric polarimeter based on Micro Pattern Gas Chamber to high energy X-rays. We calculated the sensitivity with Neon and Argon based mixtures at high pressure with thick absorption gap: placing the MPGC at focus of a next generation multi-layer ...

Announcement of “2nd International Congress on Food Science and Technology”